工程服務
封裝服務
->設計中心
->封裝能力
．前段
．後段
->厚膜基板工藝
->可靠度和失效分析
測試服務
->測試概貌
->測試設備平台
->測試服務
->測試方案介紹
->工程能力
 
测试方案介绍

Handler layout for Optical Sensor (ALS)

Handler layout for Optical Sensor (ALS) Handler layout for Optical Sensor (ALS)
  • 18 test sites
  • 6 sides AOI inspection
  • Bowl input, tape & reel output
  • Package size: 1*1mm to 10*10mm
  • UPH: ~4K –Based on test time 2936ms for ALS

Handler layout for Optical Sensor (3 in 1)

Handler layout for Optical Sensor (3 in 1)
  • 18 test sites
  • PXY/CT/ALS integrated
  • 6 sides AOI inspection
  • Bowl input, tape & reel output
  • Package size: 1*1mm to 10*10mm
  • UPH: ~3K ---Based on test time: PXY(4235ms)+CT(1657ms)+ALS(2936ms)
Handler layout for Optical Sensor (3 in 1)

Handler layout for ToF Product

SST Pick & Place Handler
Handler layout for ToF Product
Remark:
  • 3 test sites
  • Tray input / Tray output
  • Package size: 2*2mm to 10*10mm
SST Bowl Feeder Handler
Handler layout for ToF Product
Remark:
  • 9 test sites
  • Bowl in / Tape reel out
  • Package size: 1*1mm to 10*10mm
  • 6S AOI inspection

Test solution for MEMS product

HT-2000M(MEMS handler)
Test solution for MEMS product
Feature:
  • Unit size: 2x2~7x7mm
  • Test sites: 36 sites
  • Input: Bowl in/Output: Tape reel out
  • Capable for G sensor, accelerometer, Gyroscope
  • Rotation accuracy: <0.05o
  • Rotation speed of time to perform 90o rotation: Up to 800ms
  • Rotation direction:
  • X-axis: +/-185o, Y-axis: +/-185o
  • Range of angular rate: 500dps+/-0.5
SST Development Tester
SST Development Tester
Configurations:
  • Frequency: 200 MHz
  • 256/512/768 I/O.
  • Test sites: 64 sites.
  • 32/64 M pattern memory
  • SMU: 48ch
公司地址：廣東省中山市火炬開發區建業東路9號 電話：+86-760-23381357 傳真：+86-760-23382117
© Copyright 2008-2014 訊芯電子科技(中山)有限公司版權所有 | 關於訊芯控股 | 請使用IE8以上瀏覽器查看本網站(包括IE8)