Engineering Capability (HW & SW)
Engineering Capability (R&D and NPI)
R&D Services
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Provide self-developed tester solution.
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Develop customized handler to meet customer requirement.
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Design test fixtures to suit product type.
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Provide auto-test solutions for both Lab & Mass produciton.
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Test programming services for chip probing & Final testing.
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Customized software development for data analysis (GUI).
| Tester |
Handler |
Self Development Tester :
RF、digital、mix signal tester |
Self development handler :
PnP, Bowl feeder types |
 |
 |
| Hardware |
Program |
Test fixtures design :
Probe card, test board, Load board, Socket,
Test handler kit |
Test program development :
C#, Labview, PXIe driver、Pattern editor、VI curve、Shmoo tool |
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 |
Tester Development Capability
SST offers cost-effective and complete testing solutions for IC design house
| Digital signal module |
 |
| High Speed DDR Test module |
 |
| SMU module |
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| High Power SMU module |
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| High Precision DPS module |
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| RF Signal test module |
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| Audio Signal module |
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| PXI Chassis |
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| TTK CP Tester |
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| TTK FT Tester |
 |
Handler Development Capability
Developed by Talentek, adopts two turrets structure, Integrating handler and tester，can support ALS/ToF
- Support testing of ALS, ToF & LiDAR products.
- Customize 18 sites, such as 4+4+8, 6+6+6, etc.
- Machine index time is <450ms, Max UPH can reach 7.9K.
- Supports package sizes as small as 1x1mm.
- Tester in Test Handler to reduce floor space
- Average ALS test yield of 98.5~99.0 % (2024)
Hardware Development Capability
FT HW Capability
Software Development
(1)Test program and GUI development
(2)Tester software : Tester GUI
(3)Production management software : Real-time online (by site) yield monitoring/ UPH/ test time, low yield & site yield variance monitoring tool
(4)Data analysis tool : Offline Data analysis
(5)Customized software : Auto yield analysis tool for SYL/SBL/CTQ test
CP HW Capability
GUI
Yield Monitoring by Site
Test Data Analysis
Yield Analysis tool
